发明名称 Vertically stacked ReRAM device with common selector and manufacturing of the same
摘要 The present invention relates to a vertical type resistance memory device and a manufacturing method thereof capable of increasing current density by extending the size of a selection device in the vertical type resistance change memory having a resistance change material layer in a crossing point where a plurality of horizontal electrodes, and a plurality of vertical electrodes cross. The vertical type resistance memory device comprises a plurality of horizontal electrodes which laminated at constant intervals and is extended to a horizontal direction; interlayer insulating layers which are formed among the horizontal electrodes; a plurality of vertical electrodes which penetrates the horizontal electrodes and the interlayer insulating layers in the vertical direction and which have crossing points with the horizontal electrodes; a selection device function layer which is extended to a length direction according to the side walls of the vertical electrodes and controls passing current amount according to the size of voltage or polarity; a conductive layer which is formed on the interlayer insulating layers and the selection device function layer; and a resistance change material layer which varies a resistance value according to the applied voltage.
申请公布号 KR101418051(B1) 申请公布日期 2014.07.10
申请号 KR20120069609 申请日期 2012.06.28
申请人 发明人
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
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