发明名称 MICRO-COLUMN WITH DOUBLE ALIGNER
摘要 <p>The present invention relates to an ultra-small column with a double agliner and, more specifically, to an ultra-small column with a double agliner to compensate an original scanning path and an upper shaft when the original scanning path of a particle beam and the upper shaft out of a limiting aperture are separated; and to compensate efficiently the path of the particle beam by aligning the path of the particle beam to the aperture of the limiting aperture by the double agliners. As the present invention is configured to comprise the ultra-small column with a source lens, the source lens includes two aligner layers to compensate the path of the particle beam.</p>
申请公布号 KR101417603(B1) 申请公布日期 2014.07.09
申请号 KR20130022157 申请日期 2013.02.28
申请人 INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SUNMOON UNIVERSITY 发明人 KIM, HO SEOB;KIM, DAE WOOK;AHN, SEUNG JUN;OH, TAE SIK
分类号 H01J37/147;H01J37/153 主分类号 H01J37/147
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