| 摘要 |
The present invention relates to a semiconductor memory device performing a compression test operation mode. Provided is the semiconductor memory device comprising a test data generating unit generating test data in response to a command signal in a test operation mode and changing a pattern of the test data in response to the command signal, a data delivering unit storing the test data in a memory bank, and a data compressing unit compressing the data stored in the memory bank to output the data. |
