发明名称 Semiconductor device with copper wire having different width portions
摘要 To improve reliability of a semiconductor device in which wire bonding using a wire made of copper is performed. A semiconductor device is configured so that one of end parts (wide width part) of a copper wire is joined via a bump on a pad (electrode pad) formed over a main surface (first main surface) of a semiconductor chip of the semiconductor device. The bump is made of gold, which is a metal material having a hardness lower than that of copper, and the width of the bump is narrower than the width of the wide width part of the wire.
申请公布号 US8772952(B2) 申请公布日期 2014.07.08
申请号 US201012889023 申请日期 2010.09.23
申请人 Renesas Electronics Corporation 发明人 Yasunaga Masatoshi;Matsushima Hironori;Hironaga Kenya;Kuroda Soshi
分类号 H01L29/40 主分类号 H01L29/40
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A semiconductor device, comprising: a first semiconductor chip including a first main surface,a first back surface opposite to the first main surface, anda first electrode pad formed over the first main surface, a surface of the first electrode pad having a first recess; a terminal arranged next to the first semiconductor chip in plan view; and a first wire electrically connecting the first electrode pad with the terminal, wherein the first wire comprises copper; the first wire has a first wire diameter part and a first wide width part formed at one end part of the first wire diameter part; a width of the first wide width part is greater than that of the first wire diameter part; the first wide width part of the first wire is electrically connected with the first electrode pad via a first bump covering the first recess such that the first wide width part of the first wire overlaps both the first recess and a part of the surface of the first electrode pad where there is no first recess; and the first bump comprises a metal material having hardness lower than that of copper; wherein a first insulating film is formed over the first main surface such that the first electrode pad has an exposed surface in a first opening formed in the first insulating film opposite an exposed portion of the first wide width part; and a width of the first wide width part is greater than that of the first opening formed in the first insulating film.
地址 Kanagawa JP