发明名称 |
METHOD FOR MANUFACTURING REFLECTIVE MASK AND APPARATUS FOR MANUFACTURING REFLECTIVE MASK |
摘要 |
According to one embodiment, a method is disclosed for manufacturing a reflective mask. The method can include forming a reflection layer on a major surface of a substrate. The method can include forming an absorption layer on the reflection layer. The method can include forming a pattern region in the absorption layer. In addition, the method can include forming a light blocking region surrounding the pattern region in the absorption layer and the reflection layer. The forming the light blocking region includes etching-processing the reflection layer using a gas containing chlorine and oxygen. |
申请公布号 |
US2014186754(A1) |
申请公布日期 |
2014.07.03 |
申请号 |
US201414197549 |
申请日期 |
2014.03.05 |
申请人 |
Kabushiki Kaisha Toshiba ;Shibaura Mechatronics Corporation |
发明人 |
Yoshimori Tomoaki;Karyu Makoto;Motokawa Takeharu;Takai Kosuke;Kase Yoshihisa |
分类号 |
G03F1/24 |
主分类号 |
G03F1/24 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a reflective mask comprising a substrate, a reflection layer formed on a major surface of the substrate, an absorption layer formed on the reflection layer, a pattern region formed in the absorption layer, the method comprising:
forming a light blocking region surrounding the pattern region in the absorption layer and the reflection layer; and the forming the light blocking region including etching-processing the reflection layer using a gas containing chlorine and oxygen. |
地址 |
Tokyo JP |