发明名称 METHOD FOR MANUFACTURING REFLECTIVE MASK AND APPARATUS FOR MANUFACTURING REFLECTIVE MASK
摘要 According to one embodiment, a method is disclosed for manufacturing a reflective mask. The method can include forming a reflection layer on a major surface of a substrate. The method can include forming an absorption layer on the reflection layer. The method can include forming a pattern region in the absorption layer. In addition, the method can include forming a light blocking region surrounding the pattern region in the absorption layer and the reflection layer. The forming the light blocking region includes etching-processing the reflection layer using a gas containing chlorine and oxygen.
申请公布号 US2014186754(A1) 申请公布日期 2014.07.03
申请号 US201414197549 申请日期 2014.03.05
申请人 Kabushiki Kaisha Toshiba ;Shibaura Mechatronics Corporation 发明人 Yoshimori Tomoaki;Karyu Makoto;Motokawa Takeharu;Takai Kosuke;Kase Yoshihisa
分类号 G03F1/24 主分类号 G03F1/24
代理机构 代理人
主权项 1. A method for manufacturing a reflective mask comprising a substrate, a reflection layer formed on a major surface of the substrate, an absorption layer formed on the reflection layer, a pattern region formed in the absorption layer, the method comprising: forming a light blocking region surrounding the pattern region in the absorption layer and the reflection layer; and the forming the light blocking region including etching-processing the reflection layer using a gas containing chlorine and oxygen.
地址 Tokyo JP