发明名称 FLIGHT TIME BASED MASS MICROSCOPE SYSTEM FOR ULTRA HIGH-SPEED MULTI MODE MASS ANALYSIS
摘要 The present invention aims to provide a time-of-flight based mass microscope system for an ultra-high speed multi-mode mass analysis, for using a laser beam or an ion beam simultaneously to enable both a low molecular weight analysis such as for drugs/metabolome/lipids/peptides and a high molecular weight analysis such as for genes/proteins, without being limited by the molecular weight of the object being analyzed, and for significantly increasing the measuring speed by using a microscope method instead of a microprobe method.
申请公布号 US2014183354(A1) 申请公布日期 2014.07.03
申请号 US201214117116 申请日期 2012.05.03
申请人 Moon Jeong Hee;Moon Dae Won;Lee Tae Geol;Yoon Sohee;Kim Ju Hwang 发明人 Moon Jeong Hee;Moon Dae Won;Lee Tae Geol;Yoon Sohee;Kim Ju Hwang
分类号 H01J49/00;H01J49/40 主分类号 H01J49/00
代理机构 代理人
主权项 1. A time-of-flight (TOF) based mass microscope system for an ultra-high speed multi-mode mass analysis, the time-of-flight based mass microscope system performing a mass imaging analysis of a sample in a microscope mode by irradiating a laser beam, an ion beam, or any one of the laser beam and the ion beam in a defocused state on the sample, photographing an image of the sample, and simultaneously measuring and detecting a position of a secondary ion generated from the sample at the time of irradiating the laser beam or the ion beam, based on a time-of-flight (TOF), so as to perform the analysis with respect to all samples having from a low molecular weight sample to a high molecular weight sample.
地址 Goyang-si KR