| 发明名称 |
REFERENCE SPEED MEASUREMENT FOR A NON-DESTRUCTIVE TESTING SYSTEM |
| 摘要 |
A system includes a non-destructive testing (NDT) system having an NDT probe and a processor. The NDT probe includes a testing sensor and a motion sensor. The testing sensor is configured to capture sensor data from an inspection area, and the motion sensor is configured to detect a measurement speed at which the NDT probe moves relative to the inspection area. The processor is configured to determine a speed comparison between the measurement speed and a reference speed range. |
| 申请公布号 |
US2014182373(A1) |
申请公布日期 |
2014.07.03 |
| 申请号 |
US201213732268 |
申请日期 |
2012.12.31 |
| 申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
Sbihli Scott Leo;Messinger Jason Howard;De Fromont Francois Xavier;Ward Robert Carroll |
| 分类号 |
G01P1/00 |
主分类号 |
G01P1/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A system comprising:
a non-destructive testing (NDT) system comprising:
an NDT probe comprising a testing sensor and a motion sensor, wherein the testing sensor is configured to capture sensor data from an inspection area, and the motion sensor is configured to detect a measurement speed at which the NDT probe moves relative to the inspection area; anda processor configured to determine a speed comparison between the measurement speed and a reference speed range. |
| 地址 |
Schenectady NY US |
