发明名称 |
WIRELESS ENCLOSURE FOR TESTING ELECTRONIC DEVICES |
摘要 |
A system, method, and enclosure for testing wireless devices. The enclosure includes a number of walls enclosing a testing space. The enclosure also includes a sliding cover secured between the two of the number of walls. The enclosure also includes one or more radio frequency layers disposed on the number of walls and the sliding cover. |
申请公布号 |
US2014187173(A1) |
申请公布日期 |
2014.07.03 |
申请号 |
US201314143142 |
申请日期 |
2013.12.30 |
申请人 |
ATC Logistics & Electronics, Inc. |
发明人 |
Partee Jimmie Paul |
分类号 |
H04B17/00 |
主分类号 |
H04B17/00 |
代理机构 |
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代理人 |
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主权项 |
1. An enclosure for testing wireless devices comprising:
a plurality of walls enclosing a testing space; a sliding cover secured between two of the plurality of walls; and one or more radio frequency layers disposed on the plurality of walls and the sliding cover. |
地址 |
Fort Worth TX US |