| 主权项 |
1. A support method for particle distribution analysis for a substrate, the method comprising:
creating target substrate data by calculating inter-particle distances for all particles on a target substrate subjected to the particle distribution analysis from particle coordinate data of the target substrate, classifying the inter-particle distances into multiple classes, calculating the number of particles in each of the multiple classes, generating a first histogram data indicating the number of particles in each of the multiple classes, and storing the first histogram data in a storage unit; creating each virtual substrate data for a plurality of virtual substrates each having the same number of randomly distributed particles as the particles on the target substrate by calculating inter-particle distances for all particles on each virtual substrate from particle coordinate data, classifying the inter-particle distances on each virtual substrate into multiple classes, calculating the number of particles in each of the multiple classes for each virtual substrate, generating a second histogram data indicating the number of particles in each of the multiple classes for each virtual substrate, and storing the second histogram data in the storage unit; creating difference data by calculating an average for the second histogram data of the plurality of virtual substrates and calculating difference data indicating a difference between the first histogram data of the target substrate and the average, and each difference between the second histogram data of each virtual substrate and the average, and storing the difference data in the storage unit; creating determination data by calculating determination data quantifying a distance between the first histogram data of the target substrate and the second histogram data of the plurality of virtual substrates based on the difference data, and storing the determination data in the storage unit; and displaying the determination data on a display unit. |
