发明名称 Variable energy charged particle systems
摘要 Charged particle system are disclosed and include a first voltage source, a second voltage source electrically isolated from the first voltage source, a charged particle source electrically connected to the first voltage source, and an extractor electrically connected to the second voltage source. Methods relating to the charged particle systems are also disclosed.
申请公布号 US8766210(B2) 申请公布日期 2014.07.01
申请号 US201113328326 申请日期 2011.12.16
申请人 Carl Zeiss Microscopy, LLC 发明人 Hill Raymond;Notte, IV John
分类号 H01J49/10;H01J27/02;H01J27/26 主分类号 H01J49/10
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A gas field ion system, comprising: a first voltage source connected to and referenced to an electrical ground; a second voltage source connected to and referenced to the electrical ground, a voltage output of the second voltage source being independent of a voltage output of the first voltage source; a gas field ion source comprising a tip having a tip apex, the gas field ion source being electrically connected to the first voltage source so that the first voltage source is configured to apply a first voltage to the gas field ion source relative to the electrical ground; and an extractor electrically connected to the second voltage source so that the second voltage source is configured to apply a second voltage to the extractor relative to the electrical ground, wherein, during use of the gas field ion system, the second voltage is always negative relative to the electrical ground.
地址 Thornwood NY US