发明名称 |
Variable energy charged particle systems |
摘要 |
Charged particle system are disclosed and include a first voltage source, a second voltage source electrically isolated from the first voltage source, a charged particle source electrically connected to the first voltage source, and an extractor electrically connected to the second voltage source. Methods relating to the charged particle systems are also disclosed. |
申请公布号 |
US8766210(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US201113328326 |
申请日期 |
2011.12.16 |
申请人 |
Carl Zeiss Microscopy, LLC |
发明人 |
Hill Raymond;Notte, IV John |
分类号 |
H01J49/10;H01J27/02;H01J27/26 |
主分类号 |
H01J49/10 |
代理机构 |
Fish & Richardson P.C. |
代理人 |
Fish & Richardson P.C. |
主权项 |
1. A gas field ion system, comprising:
a first voltage source connected to and referenced to an electrical ground; a second voltage source connected to and referenced to the electrical ground, a voltage output of the second voltage source being independent of a voltage output of the first voltage source; a gas field ion source comprising a tip having a tip apex, the gas field ion source being electrically connected to the first voltage source so that the first voltage source is configured to apply a first voltage to the gas field ion source relative to the electrical ground; and an extractor electrically connected to the second voltage source so that the second voltage source is configured to apply a second voltage to the extractor relative to the electrical ground, wherein, during use of the gas field ion system, the second voltage is always negative relative to the electrical ground. |
地址 |
Thornwood NY US |