发明名称 |
Semiconductor wafer, method of manufacturing a semiconductor wafer, and electronic device |
摘要 |
The objective is to improve capabilities such as high-speed switching of a compound semiconductor device. Provided is a semiconductor wafer comprising a silicon wafer; an insulating film that is formed on the silicon wafer and that has an open portion reaching the silicon wafer; a Ge crystal formed in the open portion; a seed compound semiconductor crystal that is grown with the Ge crystal as a nucleus and that protrudes beyond a surface of the insulating film; and a laterally grown compound semiconductor layer that is laterally grown on the insulating film with a specified surface of the seed compound semiconductor crystal as a seed surface. |
申请公布号 |
US8766318(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US200912920455 |
申请日期 |
2009.02.27 |
申请人 |
Sumitomo Chemical Company, Limited |
发明人 |
Hata Masahiko;Takada Tomoyuki |
分类号 |
H01L29/12 |
主分类号 |
H01L29/12 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. A semiconductor wafer comprising:
a silicon wafer; an insulating film that is formed on the silicon wafer and that has an open portion reaching the silicon wafer; a nucleus Ge crystal formed in the open portion; a seed compound semiconductor crystal that is grown on top of the Ge crystal and that protrudes beyond a top surface of the insulating film; and a laterally grown compound semiconductor layer that is laterally grown on the insulating film with a specified surface of the seed compound semiconductor crystal as a seed surface. |
地址 |
Tokyo JP |