发明名称 PARTICLE BEAM IMAGE ACQUISITION APPARATUS AND METHOD FOR ACQUISITION THE SAME
摘要 <p>The present invention relates to a particle beam emission image acquisition apparatus which comprises a microchannel plate for receiving a particle beam emitted from a particle beam source and emitting a secondary electron; a fluorescent screen for receiving the secondary electron generated in the microchannel plate and converting the same into an optical signal; an image acquisition device for acquiring optical data emitted from the fluorescent screen; and an image process device for comprising a slow frequency pass filter of a spatial region and treating and imaging data obtained from the image acquisition device, and to a method for acquiring a particle beam emission image using the same.</p>
申请公布号 KR101413287(B1) 申请公布日期 2014.07.01
申请号 KR20130080447 申请日期 2013.07.09
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 HAN, CHEOL SU;CHO, BOK LAE;PARK, IN YONG;AHN, SANG JUNG
分类号 H01J37/26;H01J37/147;H01J37/22 主分类号 H01J37/26
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