发明名称 |
PARTICLE BEAM IMAGE ACQUISITION APPARATUS AND METHOD FOR ACQUISITION THE SAME |
摘要 |
<p>The present invention relates to a particle beam emission image acquisition apparatus which comprises a microchannel plate for receiving a particle beam emitted from a particle beam source and emitting a secondary electron; a fluorescent screen for receiving the secondary electron generated in the microchannel plate and converting the same into an optical signal; an image acquisition device for acquiring optical data emitted from the fluorescent screen; and an image process device for comprising a slow frequency pass filter of a spatial region and treating and imaging data obtained from the image acquisition device, and to a method for acquiring a particle beam emission image using the same.</p> |
申请公布号 |
KR101413287(B1) |
申请公布日期 |
2014.07.01 |
申请号 |
KR20130080447 |
申请日期 |
2013.07.09 |
申请人 |
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
发明人 |
HAN, CHEOL SU;CHO, BOK LAE;PARK, IN YONG;AHN, SANG JUNG |
分类号 |
H01J37/26;H01J37/147;H01J37/22 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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