发明名称 ANTIREFLECTION SUBSTRATE STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide an antireflection substrate structure which can reduce incident light reflectances at different wavelengths and a manufacturing method thereof.SOLUTION: The manufacturing method of an antireflection substrate structure 100 includes: providing a silicon wafer 110 having a first rough surface 112; forming, on the silicon wafer 110, an antireflection film 120 conformally covering the first rough surface; performing a surface treatment on the antireflection film to form a hydrophilic surface 122a on the side relatively far away from the silicon wafer, of the antireflection film; dropping a colloidal solution 130 including a solution and a plurality of nano-balls 134 capable of adhering to the hydrophilic surface, on the hydrophilic surface of the antireflection film; and performing an etching process on the hydrophilic surface of the antireflection film by taking the nano-balls as an etching mask to form a second rough surface 122 having a roughness different from that of the first rough surface.
申请公布号 JP2014115634(A) 申请公布日期 2014.06.26
申请号 JP20130227336 申请日期 2013.10.31
申请人 TATUNG CO;TATUNG UNIV 发明人 LIN CHIUNG-WEI;RUAN JHENG-JIE;CHEN YI-LIANG;LIN HSIEN-CHIEH
分类号 G02B1/11 主分类号 G02B1/11
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