发明名称 |
NITRIDE SEMICONDUCTOR EPITAXIAL WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a nitride semiconductor epitaxial wafer which allows transistors having equivalent performance to be obtained from the same semiconductor wafer with high yield when a field effect transistor is manufactured.SOLUTION: A nitride semiconductor epitaxial wafer at least comprises: a substrate 2; a first nitride semiconductor layer 4; and a second nitride semiconductor layer 5 which is formed on the first nitride semiconductor layer 4 and has electron affinity smaller than that of the first nitride semiconductor layer 4. A value obtained by dividing a standard deviation of film thicknesses of the second nitride semiconductor layer 5 by an average value of the film thicknesses and multiplying the resultant by 100 and normalizing the multiplied resultant is less than 5% and fluctuation of sheet resistance depending on existence and non-existence of light irradiation is less then 10%. |
申请公布号 |
JP2014116389(A) |
申请公布日期 |
2014.06.26 |
申请号 |
JP20120268015 |
申请日期 |
2012.12.07 |
申请人 |
HITACHI METALS LTD |
发明人 |
TANAKA TAKESHI;NARITA YOSHINOBU |
分类号 |
H01L29/812;H01L21/205;H01L21/338;H01L29/778 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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