METHOD FOR TESTING A SENSOR CIRCUIT

摘要

The invention relates to a method for testing a sensor circuit (28) that is held in a retaining frame (46) and is connected on a wiring support (48), said support (48) being connected to the retaining frame (46) via two terminals (52) that make contact with the sensor circuit (28), said method comprising the steps: isolating (66) a contact terminal (52) from the retaining frame (46); electrically connecting (74, 76) the contact terminals (52) to a test circuit (78); and testing the sensor circuit (28) by means of the connected test circuit (78).