发明名称 |
PHOTORESIST REMOVER |
摘要 |
Disclosed is a cleaning solution with low etching ability suitable for cleaning a relatively thick photoresist. The photoresist cleaning solution with low etching ability contains (a) a quaternary ammonium hydroxide, (b) an ethanol amine, (c) a sugar or sugar alcohol, (d) a surfactant, and (e) a solvent. The photoresist cleaning agent with low etching ability can effectively remove the photoresist on a semiconductor wafer, and at the same time fundamentally won't attack a substrate of metals such as aluminum, copper and the like, and has good application prospects in the field of semiconductor wafer cleaning etc. |
申请公布号 |
WO2014094356(A1) |
申请公布日期 |
2014.06.26 |
申请号 |
WO2013CN01501 |
申请日期 |
2013.12.03 |
申请人 |
ANJI MICROELECTRONICS TECHNOLOGY (SHANGHAI) CO., LTD |
发明人 |
LIU, BING;PENG, HONGXIU;SUN, GUANGSHENG;YAN, JINLI |
分类号 |
C11D7/26;C11D7/32;C11D7/34;G03F7/42 |
主分类号 |
C11D7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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