发明名称 PHOTORESIST REMOVER
摘要 Disclosed is a cleaning solution with low etching ability suitable for cleaning a relatively thick photoresist. The photoresist cleaning solution with low etching ability contains (a) a quaternary ammonium hydroxide, (b) an ethanol amine, (c) a sugar or sugar alcohol, (d) a surfactant, and (e) a solvent. The photoresist cleaning agent with low etching ability can effectively remove the photoresist on a semiconductor wafer, and at the same time fundamentally won't attack a substrate of metals such as aluminum, copper and the like, and has good application prospects in the field of semiconductor wafer cleaning etc.
申请公布号 WO2014094356(A1) 申请公布日期 2014.06.26
申请号 WO2013CN01501 申请日期 2013.12.03
申请人 ANJI MICROELECTRONICS TECHNOLOGY (SHANGHAI) CO., LTD 发明人 LIU, BING;PENG, HONGXIU;SUN, GUANGSHENG;YAN, JINLI
分类号 C11D7/26;C11D7/32;C11D7/34;G03F7/42 主分类号 C11D7/26
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