发明名称 METHOD FOR FORMING COPPER WIRING
摘要 In a Cu wiring forming method for forming a Cu wiring by filling Cu in a recess which is formed in a substrate in a predetermined pattern, a barrier film formed of a TaAlN film is formed at least on the surface of the recess by thermal ALD or thermal CVD. Then a Cu film is formed to fill the recess with the Cu film. Further, the Cu wiring is formed in the recess by polishing the entire surface of the substrate by CMP.
申请公布号 US2014175046(A1) 申请公布日期 2014.06.26
申请号 US201314136838 申请日期 2013.12.20
申请人 Tokyo Electron Limited 发明人 ISHIZAKA Tadahiro;HASEGAWA Toshio
分类号 H05K3/10 主分类号 H05K3/10
代理机构 代理人
主权项 1. A Cu wiring forming method for forming a Cu wiring by filling Cu in a recess, which is formed in a substrate in a predetermined pattern, the Cu wiring forming method comprising: forming a barrier film formed of a TaAlN film at least on a surface of the recess by thermal ALD or thermal CVD; forming a Cu film to fill the recess with the Cu film; and forming a Cu wiring in the recess by polishing the entire surface of the substrate by CMP.
地址 Tokyo JP