ELECTROMIGRATION ANALYSIS FOR STANDARD CELL BASED DESIGNS

摘要

Methods and media for analyzing electrical designs are provided. A method includes and the media are configured for providing or loading to an analysis tool a design that includes a plurality of cell instances of a standard cell and estimating a failure rate of the design using in context electrical parameters for the plurality of cell instances and a parameterized electromigration (EM) view of the standard cell. Another method includes providing a standard cell of a standard cell library and characterizing the standard cell to create a parameterized thermal model to compute a temperature of an internal structure of the standard cell and a parameterized current model to compute a current through the internal structure of the standard cell given in context electrical parameters.

主权项

1. A method comprising:
generating, by a processor performing operations for an analysis tool, an estimate of a failure rate of a design that includes a plurality of cell instances of a standard cell using in context electrical parameters for the plurality of cell instances and a parameterized electromigration (EM) view of the standard cell, the estimate including external heating effects on each cell instance of the standard cell caused by at least one of a substrate or a neighbor at corresponding temperatures.