发明名称 |
Liquid crystal display device and polarizing plate |
摘要 |
Provided is a liquid crystal display in which occurrence of iridescent unevenness is suppressed, even when a film with high level of mechanical properties, chemical resistance and water-barrier properties is used as a polarizer-protective-film. Also, disclosed is a polarizing plate to be used in the liquid crystal display. The liquid crystal display includes a liquid crystal cell, a light source, a first polarizing plate placed between the liquid crystal cell and the light source, and a second polarizing plate placed on a viewer side of the liquid crystal cell. The first polarizing plate includes a polarizer and a first protective film placed on a light source side principal surface of the first protective film, and the first protective film satisfies following relations: (i) 0 nm≦Re1≦3000 nm; (ii) Nz1≧5; and (iii) Rth1>2500 nm. |
申请公布号 |
US8760601(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US200913123333 |
申请日期 |
2009.10.09 |
申请人 |
Nitto Denko Corporation |
发明人 |
Izaki Akinori;Umemoto Seiji;Yamamoto Shouji;Takeda Kentarou;Suzuki Mitsuru |
分类号 |
G02F1/1335 |
主分类号 |
G02F1/1335 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. A liquid crystal display, comprising:
a liquid crystal cell; a light source; a first polarizing plate placed between the liquid crystal cell and the light source; and a second polarizing plate placed on a viewer side of the liquid crystal cell, wherein the first polarizing plate comprises a polarizer and a first protective film placed on a light source side principal surface thereof, wherein, among protective films included in first polarizing plate and the second polarizing plate, only the first protective film satisfies following relations: (i) 0 nm≦Re1≦3000 nm; (ii) Nz1≧5; and (iii) Rth1>2500 nm, wherein Re1, Rth1 and Nz1 are defined by following equations:
Re1=(nx1−ny1)d1;Rth1=(nx1−nz1)d1; andNz1=Rth1/Re1,wherein
d1 represents a thickness of the first protective film,nx1 represents a refractive index in a direction of an in-plane slow axis of the protective film,ny1 represents a refractive index in a direction of an in-plane fast axis of the protective film, andnz1 represents a refractive index in a direction of the thickness of the protective film, andeach refractive index being measured at 23° C. at a measurement wavelength of 590 nm; wherein light emitted from the light source is incident on the first polarizing plate in the form of substantially natural light with an Im/Ix ratio of 0.90 or more, wherein Ix and Im represents maximum and minimum, respectively, of light intensity measured by rotating analyzer method, in which analyzer is rotated by 360°.
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地址 |
Ibaraki-shi JP |