| 发明名称 |
Method for processing samples held by a nanomanipulator |
| 摘要 |
A method for processing a sample in a charged-particle beam microscope. A sample is collected from a substrate and the sample is attached to the tip of a nanomanipulator. The sample is optionally oriented to optimize further processing. The nanomanipulator tip is brought into contact with a stabilizing support to minimize drift or vibration of the sample. The attached sample is then stabilized and available for preparation and analysis. |
| 申请公布号 |
US8759765(B2) |
申请公布日期 |
2014.06.24 |
| 申请号 |
US201213567487 |
申请日期 |
2012.08.06 |
| 申请人 |
Omniprobe, Inc. |
发明人 |
Hartfield Cheryl D.;Moore Thomas M.;Miller Brian P. |
| 分类号 |
G01N23/00;G21K7/00 |
主分类号 |
G01N23/00 |
| 代理机构 |
|
代理人 |
Thomas John A. |
| 主权项 |
1. A method for processing a sample held by a nanomanipulator tip comprising:
bringing the nanomanipulator tip into contact with a stabilizing support; and, stabilizing the sample using feedback control; where stabilizing the sample using feedback control further comprises:
continuing to move the nanomanipulator tip against the stabilizing support until substantially no discernible vibration of the sample is observable.
|
| 地址 |
Dallas TX US |
