发明名称 CIRCUIT DESIGN SUPPORT METHOD, CIRCUIT DESIGN SUPPORT APPARATUS, AND COMPUTER PRODUCT
摘要 A circuit design support method that is executed by a computer, includes calculating a first performance value of a circuit under design before a layout process, by inputting into a first function model that represents a performance value of the circuit under design before the layout process, the values of parameters among parameters of a second parameter group and corresponding to parameters of a first parameter group; acquiring a second performance value that is of the circuit under design after the layout process and obtained by simulating operation of the circuit under design after the layout process, using the values of the parameters of the second parameter group; and generating based on the calculated first performance value, the acquired second performance value, and the second parameter group, a second function model that represents a difference in the performance value of the circuit under design before and after the layout process.
申请公布号 US2014173540(A1) 申请公布日期 2014.06.19
申请号 US201314066240 申请日期 2013.10.29
申请人 FUJITSU LIMITED 发明人 LIU YU
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A circuit design support method that is executed by a computer, the circuit design support method comprising: calculating, by using the computer, a first performance value of a circuit under design before a layout process, the first performance value being calculated by using a first parameter group that represents properties of elements of the circuit under design before the layout process, to refer to a storage unit that stores values of parameters of a second parameter group that represent properties of the elements of the circuit under design after the layout process, and inputting into a first function model that represents a performance value of the circuit under design before the layout process, the values of the parameters that are among the parameters of the second parameter group and correspond to parameters of a first parameter group; acquiring a second performance value of the circuit under design after the layout process, the second performance value being obtained by simulating operation of the circuit under design after the layout process, using the values of the parameters of the second parameter group stored in the storage unit; and generating a second function model that represents a difference in the performance value of the circuit under design before and after the layout process, the second function model being generated based on the calculated first performance value, the acquired second performance value, and the values of the parameters of the second parameter group stored in the storage unit and by using the second parameter group.
地址 Kawasaki-shi JP