发明名称 Charge dissipation of cavities
摘要 Structures and methods for the dissipation of charge build-up during the formation of cavities in semiconductor substrates.
申请公布号 US8753974(B2) 申请公布日期 2014.06.17
申请号 US200711765768 申请日期 2007.06.20
申请人 Micron Technology, Inc. 发明人 Griffin Brian;Benson Russ
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 Wells St. John P.S. 代理人 Wells St. John P.S.
主权项 1. A method of fabricating a cavity that extends into a semiconductor substrate, comprising: providing a semiconductor substrate that includes a silicon oxide-containing material over a base semiconductor material; depositing a metallic dissipation layer over an upper surface of the silicon oxide-containing material; the metallic dissipation layer being composed of a dissipation material; forming a hard mask over the metallic dissipation layer; etching through the hard mask, through the metallic dissipation layer and into the silicon oxide-containing material to form a cavity that extends into the silicon oxide-containing material; a portion of the dissipation material being dislodged and sputtered into the cavity during the etching; the dissipation material sputtered into the cavity forming conductive paths to dissipate electrical charge in the cavity; and prior to sputtering at least some of said portion of the dissipation material into the cavity, recessing the hard mask relative to the metallic dissipation layer to leave an exposed ledge of the metallic dissipation layer.
地址 Boise ID US