发明名称 |
METHODS AND SYSTEMS FOR INTEGRATED PLOT TRAINING |
摘要 |
A method for correlating data collected from at least one sensor of a first machine of a first type with a malfunction of the first machine is provided. The method is implemented by a computing device. The method includes storing, in a memory coupled to the computing device, an analysis data set based on measurement information from the at least one sensor. The method further includes storing, in the memory, at least one reference data set corresponding with a malfunction of a second machine, the second machine being of the first type. Additionally, the method includes displaying, with a display device, a first plot representing the analysis data set. Further, the method includes displaying, with the display device, a second plot representing one reference data set of the at least one reference data set. |
申请公布号 |
US2014160152(A1) |
申请公布日期 |
2014.06.12 |
申请号 |
US201213707914 |
申请日期 |
2012.12.07 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
Williams Scott Terrell;Robertson David Michael |
分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for correlating data collected from at least one sensor of a first machine of a first type with a malfunction of the first machine, said method implemented by a computing device, said method comprising:
storing, in a memory coupled to the computing device, an analysis data set based on measurement information from the at least one sensor; storing, in the memory, at least one reference data set corresponding with a malfunction of a second machine, the second machine being of the first type; displaying, with a display device, a first plot representing the analysis data set; and displaying, with the display device, a second plot representing one reference data set of the at least one reference data set.
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地址 |
Schenectady NY US |