发明名称 |
SELF-RECTIFYING RRAM CELL STRUCTURE AND 3D CROSSBAR ARRAY ARCHITECTURE THEREOF |
摘要 |
The present disclosure provides a self-rectifying RRAM, including: a first electrode layer formed of a first metal element; a second electrode layer formed of a second metal element different from the first metal element; and a first resistive-switching layer and a second resistive-switching layer sandwiched between the first electrode layer and the second electrode layer, wherein the first resistive-switching layer and the second switching layer form an ohmic contact, and the first resistive-switching layer has a first bandgap lower than a second bandgap of the second resistive-switching layer. Furthermore, an RRAM 3D crossbar array architecture is also provided. |
申请公布号 |
US2014158967(A1) |
申请公布日期 |
2014.06.12 |
申请号 |
US201314025299 |
申请日期 |
2013.09.12 |
申请人 |
Winbond Electronics Corp. |
发明人 |
HOU Tuo-Hung;HSU Chung-Wei;Wang I-Ting |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A self-rectifying RRAM cell structure, comprising
a first electrode layer formed of a first metal element; a second electrode layer formed of a second metal element different from the first metal element; and a first resistive-switching layer and a second resistive-switching layer sandwiched between the first electrode layer and the second electrode layer, wherein the first resistive-switching layer and the second switching layer form an ohmic contact, and the first resistive-switching layer has a first bandgap lower than a second bandgap of the second resistive-switching layer.
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地址 |
Taichung City TW |