发明名称
摘要 There is provided an electronic component inspection apparatus. The electronic component inspection apparatus includes a first rotation unit, rotatable based on a first rotating shaft, a plurality of second rotation units rotatably provided in the first rotation unit based on a second rotating shaft, and an inspection unit inspecting characteristics of an electronic component mounted in the second rotation unit.
申请公布号 JP5521232(B2) 申请公布日期 2014.06.11
申请号 JP20120166666 申请日期 2012.07.27
申请人 发明人
分类号 G01R31/00;G01R27/02;G01R27/26 主分类号 G01R31/00
代理机构 代理人
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