| 摘要 |
The invention relates to a high-frequency measurement setup for measuring a high-frequency test object, in particular, and antenna, comprising - one or more reflectors for high-frequency signals, - a laser tracker, - retrotargets for laser beams of the laser tracker that are disposed on the reflectors and are provided to orient the high-frequency test object, and - a measuring unit that is designed to actuator the laser tracker in such a way that the high-frequency test object and one or more reflectors are measured in terms of their propagation of high-frequency signals. |
