发明名称 Plasma source pumping and gas injection baffle
摘要 A plasma processing system. The processing system comprises a process chamber having first and second ends arranged such that the first end opposes the second end. A substrate support is positioned at the first end of the process chamber and is configured to support a substrate. An exhaust system is positioned proximate the second end of the process chamber and draws a vacuum on the process chamber. Between the exhaust system and substrate support there is a plurality of super-Debye openings, and between the exhaust system and the plurality of super-Debye openings is a plurality of sub-Debye openings. The super-Debye openings are configured to limit diffusion of plasma while the sub-Debye openings are configured to quench plasma.
申请公布号 US8747610(B2) 申请公布日期 2014.06.10
申请号 US201213436760 申请日期 2012.03.30
申请人 Tokyo Electron Limited 发明人 Chen Lee;Funk Merritt
分类号 C23F1/00 主分类号 C23F1/00
代理机构 代理人
主权项 1. A plasma processing system comprising: a process chamber having first and second ends, the first end opposing the second end; a substrate support configured to support a substrate thereon, the substrate support being positioned at the first end of the process chamber; an exhaust system configured to draw a vacuum and operably coupled proximate the second end of the process chamber; a plurality of super-Debye openings positioned between the exhaust system and the substrate support and configured to limit diffusion of a plasma therethrough; and a plurality of sub-Debye openings positioned between the exhaust system and the plurality of super-Debye openings and configured to quench the diffusing plasma.
地址 Tokyo JP