发明名称 |
Plasma source pumping and gas injection baffle |
摘要 |
A plasma processing system. The processing system comprises a process chamber having first and second ends arranged such that the first end opposes the second end. A substrate support is positioned at the first end of the process chamber and is configured to support a substrate. An exhaust system is positioned proximate the second end of the process chamber and draws a vacuum on the process chamber. Between the exhaust system and substrate support there is a plurality of super-Debye openings, and between the exhaust system and the plurality of super-Debye openings is a plurality of sub-Debye openings. The super-Debye openings are configured to limit diffusion of plasma while the sub-Debye openings are configured to quench plasma. |
申请公布号 |
US8747610(B2) |
申请公布日期 |
2014.06.10 |
申请号 |
US201213436760 |
申请日期 |
2012.03.30 |
申请人 |
Tokyo Electron Limited |
发明人 |
Chen Lee;Funk Merritt |
分类号 |
C23F1/00 |
主分类号 |
C23F1/00 |
代理机构 |
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代理人 |
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主权项 |
1. A plasma processing system comprising:
a process chamber having first and second ends, the first end opposing the second end; a substrate support configured to support a substrate thereon, the substrate support being positioned at the first end of the process chamber; an exhaust system configured to draw a vacuum and operably coupled proximate the second end of the process chamber; a plurality of super-Debye openings positioned between the exhaust system and the substrate support and configured to limit diffusion of a plasma therethrough; and a plurality of sub-Debye openings positioned between the exhaust system and the plurality of super-Debye openings and configured to quench the diffusing plasma.
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地址 |
Tokyo JP |