发明名称 ETCHANT FOR SEMICONDUCTOR SUBSTRATE, ETCHING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an etchant capable of selectively and efficiently removing a first layer containing TiN with respect to a second layer containing a specific metal and achieving surface uniformity of a TiN layer after etching, an etching method for using the same, and a method for manufacturing a semiconductor element.SOLUTION: An etchant for selectively removing a first layer by processing a substrate having a first layer containing titanium nitride (TiN) and a second layer containing transition metal includes a fluorine-containing compound, an oxidizing agent, and an organosilicon compound.
申请公布号 JP2014103179(A) 申请公布日期 2014.06.05
申请号 JP20120252748 申请日期 2012.11.16
申请人 FUJIFILM CORP 发明人 KAMIMURA TETSUYA;MURO SUKETSUGU;INABA TADASHI
分类号 H01L21/308;H01L21/306;H01L21/768 主分类号 H01L21/308
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