发明名称 |
ETCHANT FOR SEMICONDUCTOR SUBSTRATE, ETCHING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide an etchant capable of selectively and efficiently removing a first layer containing TiN with respect to a second layer containing a specific metal and achieving surface uniformity of a TiN layer after etching, an etching method for using the same, and a method for manufacturing a semiconductor element.SOLUTION: An etchant for selectively removing a first layer by processing a substrate having a first layer containing titanium nitride (TiN) and a second layer containing transition metal includes a fluorine-containing compound, an oxidizing agent, and an organosilicon compound. |
申请公布号 |
JP2014103179(A) |
申请公布日期 |
2014.06.05 |
申请号 |
JP20120252748 |
申请日期 |
2012.11.16 |
申请人 |
FUJIFILM CORP |
发明人 |
KAMIMURA TETSUYA;MURO SUKETSUGU;INABA TADASHI |
分类号 |
H01L21/308;H01L21/306;H01L21/768 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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