发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for manufacturing a highly-reliable thin-film transistor with a small amount of leakage current.SOLUTION: A method for manufacturing a thin-film transistor comprises the steps of: forming a back channel portion in the thin-film transistor by etching using a resist mask; removing the resist mask; and removing an etching residue or the like on the back channel portion by etching a part of the back channel portion. Thereby leakage current caused by the residue or the like can be reduced. Using dry etching using no bias is preferable when further etching the back channel portion.</p>
申请公布号 JP2014103417(A) 申请公布日期 2014.06.05
申请号 JP20140026046 申请日期 2014.02.14
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAIRI HIDEKAZU;SASAGAWA SHINYA;ISHIZUKA AKIHIRO
分类号 H01L29/786;G09F9/30 主分类号 H01L29/786
代理机构 代理人
主权项
地址