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1. A method for evaluating the effects of environmental air on a processed circuit board, the method comprising:
a) providing a test probe comprising a circuit board processed by a method to be evaluated, wherein the test probe comprises a pair of traces and circuitry effective for determining the electrical resistance between said traces, wherein the traces are separated by a test distance; b) measuring the electrical resistance between the two traces of said test probe at a first test probe measurement time; c) communicating information relating to the measured electrical resistance between the two traces of said test probe as measured at said first time to a device that stores data, or analyzes data, or stores and analyzes data; d) confirming that the measured electrical resistance between the two traces of said test probe as measured at said first time is at an acceptable level as defined by a pre-determined acceptance standard; e) exposing the test probe to environmental air to be tested; f) making one or more subsequent measurements of the electrical resistance between the two traces of said test probe after exposure of the test probe to environmental air; g) communicating information relating to the one or more subsequent measurements to a device that stores data, or analyzes data, or stores and analyzes data; and h) determining when the measured electrical resistance between the two traces of said test probe changes to an unacceptable level as defined by a pre-determined acceptance standard.
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