TEST SYSTEM TESTING CMOS IMAGE SENSOR AND DRIVING METHOD THEREOF

摘要

According to the embodiment of the present invention, a test system includes: a test device configured to transmit an input signal and a control signal to at least one complementary metal-oxide semiconductor (CMOS) image sensor via a probe card, and an interface board configured to map the probe card and the test device, wherein the interface board includes an output receiver configured to receive an image signal from the CMOS image sensor and to transform the image signal into an image data.