发明名称 |
PLANE DISTORTION MEASURING DEVICE AND METHOD |
摘要 |
A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means 2 capable of switching and displaying a plurality of kinds of light-and-shade patterns 5, capturing means 3 for capturing mirror images, reflected in the specular or semi-specular surface of a measurement target 1, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating means 10 for performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface. |
申请公布号 |
EP1925908(A4) |
申请公布日期 |
2014.06.04 |
申请号 |
EP20060798168 |
申请日期 |
2006.09.14 |
申请人 |
JFE STEEL CORPORATION;JFE TECHNO-RESEARCH CORPORATION |
发明人 |
SATO, KENTARO;SAITO, TAKANOBU;IWAMA, TAKASHI;YOSHITAKE, AKIHIDE;UESUGI, MITSUAKI |
分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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