发明名称 VARIABLE RESISTANCE MEMORY DEVICE
摘要 The present invention relates to a variable resistance memory device and a method for forming the same. A variable resistance memory device according to the present invention includes a first electrode; a second electrode spaced apart from the first electrode; a resistance variable layer and a metal-insulator transition layer provided between the first electrode and the second electrode; and a heat barrier layer provided (i) between the first electrode and the metal-insulator transition layer, (ii) between the metal-insulator transition layer and the resistance variable layer, or (iii) between the second electrode and the metal-insulator transition layer. The present invention prevents dissipation of heat generated in the metal-insulator transition layer using a thermal boundary resistance (TBR) phenomenon, and thus current and voltage to operate the variable resistance memory device can be reduced.
申请公布号 US2014145140(A1) 申请公布日期 2014.05.29
申请号 US201313843180 申请日期 2013.03.15
申请人 SK HYNIX INC. 发明人 KIM SOO GIL
分类号 H01L45/00 主分类号 H01L45/00
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