发明名称 THICKNESS MEASUREMENT SYSTEM AND THICKNESS MEASUREMENT METHOD
摘要 Thickness measurement apparatuses 1 and 2 are set a preset distance Ld from each other. The first apparatus 1 performs calibration using a thickness reference plate 5c. While the second apparatus 2, placed on a downstream side in a conveying direction, is performing measurement process, mode setter 3 sets “measurement” for the first apparatus 1. Mode setter 3 further gives an instruction to start a “thickness correction” process to the second apparatus 2. Mode setter 3 delays a first thickness measurement value 1 until a position corresponding to the distance is reached in a traveling distance, determines the difference between the first value 1 and a second thickness measurement value 2 from the second apparatus 2 as a correction value, and executes thickness correction without halting the measurement performed by the second apparatus 2.
申请公布号 KR20140064999(A) 申请公布日期 2014.05.28
申请号 KR20147010727 申请日期 2012.12.25
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FURUTA TETSUO;ISHIZUKA TERUO
分类号 G01B11/06;G01C3/00 主分类号 G01B11/06
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