发明名称 Increasing the length of debug messages used in integrated circuit testing to mitigate message corruption
摘要 An integrated circuit chip device comprises debugging circuitry to debug the system circuitry, the debugging circuitry being segmented into zones, wherein the debugging circuitry comprises an interconnect fabric configured to route debug messages through a zone from a zone entry node to a zone exit node. The debugging circuitry is configured to, on receiving a debug message at a zone entry node that is shorter than a specified length, modify the debug message by increasing the length of the debug message to the specified length. The message length may be determined from the message header or by counting the number of bytes in the message. A corruption marker may be added to a message that is shorter than expected. Increasing the length of the message to the specified length allows the message to be properly routed to its destination.
申请公布号 GB2508126(A) 申请公布日期 2014.05.21
申请号 GB20140004994 申请日期 2014.03.20
申请人 ULTRASOC TECHNOLOGIES LTD 发明人 IAIN ROBERTSON;ANDREW BRIAN THOMAS HOPKINS
分类号 G01R31/317;G06F11/36 主分类号 G01R31/317
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