| 摘要 |
<p>PROBLEM TO BE SOLVED: To detect the presence or absence of a transition fault and facilitate locating the transition fault that has occurred.SOLUTION: A semiconductor device comprises: flip-flop groups GR_1 to GR_L of L stages (L≥3); and L-1 pieces of combinational logic circuits CLC_1 to CLC_L-1 which are arranged one by one between the flip-flop groups GR_1 to GR_L of L stages. A scan chain is constituted so as to repeat the following operation: one scan flip-flop SFF is sequentially connected for each of the flip-flop groups from the first-stage flip-flop group GR_1 to the last-stage flip-flop group GR_L, and then, the one scan flip-flop SFF is again sequentially connected for each of the flip-flop groups from the first-stage flip-flop group GR_1 to the last-stage flip-flop group GR_L.</p> |
