| 摘要 |
The invention concerns a micrometric measuring bench for measuring dimensions of parts by mechanical contact, comprising: - a rigid frame provided with a clearance intended to receive a part to be measured, - two pins mounted in the frame aligned according to an axis X, to either side of the clearance, so as to come into contact with a part to be measured, at least one being slidable along axis X, and - a sensor connected to the sliding pin, and providing an indication of the distance between the pins. According to the invention, the frame comprises at least first and second adjacent planar guide surfaces, extending on each side of the clearance, defining two non-parallel planes, of which the intersection defines the axis X, and the pins are mounted in the frame up against the guide surfaces. |
