发明名称 METHOD AND APPARATUS FOR INSPECTING DEFECT OF TOUCH PANEL
摘要 <p>The present invention provides an inspecting method and an inspecting apparatus of a defect for a touch panel, which can be used to inspect whether a short circuit occurs in the touch panel. According to an embodiment of the present invention, the inspecting apparatus of a defect for the touch panel comprises a stage on which the touch panel is mounted; a touch panel driving circuit which supplies a driving pulse to Tx lines of the touch panel and which converts outputs of the sensor nodes received through Rx lines to digital data to output touch raw data; and a haberdashery determination unit which analyzes the touch raw data to inspect whether a short circuit occurs in the touch panel.</p>
申请公布号 KR20140057980(A) 申请公布日期 2014.05.14
申请号 KR20120124399 申请日期 2012.11.05
申请人 LG DISPLAY CO., LTD. 发明人 BAE, JUNG TAE;OH, SEUNG SEOK;OH, JUN SEOK;SHIN, MYUNG HO
分类号 G01R31/02;G01R31/3183;G06F3/041 主分类号 G01R31/02
代理机构 代理人
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