发明名称 |
METHOD AND APPARATUS FOR INSPECTING DEFECT OF TOUCH PANEL |
摘要 |
<p>The present invention provides an inspecting method and an inspecting apparatus of a defect for a touch panel, which can be used to inspect whether a short circuit occurs in the touch panel. According to an embodiment of the present invention, the inspecting apparatus of a defect for the touch panel comprises a stage on which the touch panel is mounted; a touch panel driving circuit which supplies a driving pulse to Tx lines of the touch panel and which converts outputs of the sensor nodes received through Rx lines to digital data to output touch raw data; and a haberdashery determination unit which analyzes the touch raw data to inspect whether a short circuit occurs in the touch panel.</p> |
申请公布号 |
KR20140057980(A) |
申请公布日期 |
2014.05.14 |
申请号 |
KR20120124399 |
申请日期 |
2012.11.05 |
申请人 |
LG DISPLAY CO., LTD. |
发明人 |
BAE, JUNG TAE;OH, SEUNG SEOK;OH, JUN SEOK;SHIN, MYUNG HO |
分类号 |
G01R31/02;G01R31/3183;G06F3/041 |
主分类号 |
G01R31/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|