发明名称 MASK BLANK AND PHOTOMASK
摘要 <p>PROBLEM TO BE SOLVED: To provide a mask blank capable of manufacturing a photomask having a structure effectively preventing electrostatic breakdown.SOLUTION: An electrostatic breakdown preventive film 2 is formed to cover the entire surface of one side of a mask substrate 1, and a light-shielding film 3 is formed atop the electrostatic breakdown preventive film 2. A photomask is prepared by patterning the light-shielding film 3. The electrostatic breakdown preventive film 2 is a film consisting of titanium, titanium compound, tantalum, or tantalum compound, exhibiting transmissivities of at least 75% in relation to lights of exposure wavelengths, and bearing a sheet resistance value of 100 KΩ/sq. or below. In a case where the electrostatic breakdown preventive film 2 consists of a titanium compound or tantalum compound, the film is prepared by means of sputtering using a gas obtained by adding, to an argon gas, an oxygen gas and a nitrogen gas or a carbon dioxide gas and a nitrogen gas.</p>
申请公布号 JP2014081449(A) 申请公布日期 2014.05.08
申请号 JP20120228448 申请日期 2012.10.15
申请人 CLEAN SURFACE GIJUTSU:KK 发明人 HATTORI ISAO
分类号 G03F1/40 主分类号 G03F1/40
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