发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device having a trench structure that is capable of improving a dielectric strength voltage, and provide a method of manufacturing the semiconductor device.SOLUTION: The semiconductor device comprises: a first n-type semiconductor layer 11; a second n-type semiconductor layer 12; a p-type semiconductor layer 13; a trench 3 penetrating the p-type semiconductor layer 13 to the second n-type semiconductor layer 12; an insulator layer 5 formed in a bottom 3a and a side 3b of the trench 3 along the surface of the trench 3; a gate electrode insulated from the second n-type semiconductor layer 12 and the p-type semiconductor layer 13 by the insulation layer 5; and an n-type semiconductor region 14 formed on the p-type semiconductor layer 13 and around the trench 3. At least a part of the gate electrode is formed inside the trench 3. The manufacturing method comprises forming at least a part of the insulation layer 5 in the trench 3 by sputtering.</p> |
申请公布号 |
JP2014082520(A) |
申请公布日期 |
2014.05.08 |
申请号 |
JP20140000142 |
申请日期 |
2014.01.06 |
申请人 |
ROHM CO LTD |
发明人 |
NAKANO YUUKI |
分类号 |
H01L29/78;H01L21/28;H01L21/283;H01L21/336;H01L29/12;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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