发明名称 Method of measuring using terahertz light
摘要 <p>A measuring equipment utilizing terahertz pulse light, includes : a terahertz light generator that generates terahertz pulse light; a terahertz light detector that detects terahertz pulse light; a first condensing optical system that condenses the terahertz pulse light generated by the terahertz light generator; and a second condensing optical system that condenses the terahertz pulse light diverging after being condensed by the first condensing optical system, onto the terahertz light detector. A sample is arranged in a vicinity of a position of condensing the terahertz pulse light by the first condensing optical system; and at least one of the first and the second condensing optical systems includes at least one optical device having a positive or negative refractive power. The measuring equipment further includes: a position adjusting mechanism that adjusts a position of the at least one optical device on an optical axis when the terahertz light detector detects the terahertz pulse light having transmitted through the sample; and a controlling unit that controls the position adjusting mechanism.</p>
申请公布号 EP1826553(B1) 申请公布日期 2014.05.07
申请号 EP20050805481 申请日期 2005.11.01
申请人 TOCHIGI NIKON CORPORATION;NIKON CORPORATION 发明人 TSUMURA, NAOKI;FUKUSHIMA, KAZUSHIRO
分类号 G01N21/35;G01N21/3563;G01N21/3586 主分类号 G01N21/35
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