发明名称 |
Self-diagnosis system and test circuit determination method |
摘要 |
Provided are a self-diagnosis system and a test circuit determination method that are capable of determining normality of a test circuit which diagnoses a test target circuit. A self-diagnosis system according to an aspect of the present invention includes a test circuit including first and second diagnosis controllers which determine normality of a test target circuit by using an execution result of a test pattern in the test target circuit; and a test circuit determination unit which determines normality of the test circuit by comparing a normality determination result of the test target circuit output from the first diagnosis controller with a normal determination result of the test target circuit output from the second diagnosis controller. |
申请公布号 |
US8719650(B2) |
申请公布日期 |
2014.05.06 |
申请号 |
US201113086852 |
申请日期 |
2011.04.14 |
申请人 |
MATSUO MASAFUMI;RENESAS ELECTRONICS CORPORATION |
发明人 |
MATSUO MASAFUMI |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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