发明名称 Self-diagnosis system and test circuit determination method
摘要 Provided are a self-diagnosis system and a test circuit determination method that are capable of determining normality of a test circuit which diagnoses a test target circuit. A self-diagnosis system according to an aspect of the present invention includes a test circuit including first and second diagnosis controllers which determine normality of a test target circuit by using an execution result of a test pattern in the test target circuit; and a test circuit determination unit which determines normality of the test circuit by comparing a normality determination result of the test target circuit output from the first diagnosis controller with a normal determination result of the test target circuit output from the second diagnosis controller.
申请公布号 US8719650(B2) 申请公布日期 2014.05.06
申请号 US201113086852 申请日期 2011.04.14
申请人 MATSUO MASAFUMI;RENESAS ELECTRONICS CORPORATION 发明人 MATSUO MASAFUMI
分类号 G01R31/28 主分类号 G01R31/28
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