发明名称 Comprehensive analysis of queue times in microelectronic manufacturing
摘要 A system for determining a group of semiconductor manufacturing process steps with a similar influence on individual semiconductor products. The system generates a first table including time stamps for the individual semiconductor products. The system creates a second table including Q-times based on the first table. The Q-times refers to time differences between every pair of the time stamps. The system forms a dependency table by grouping the Q-times with similar dependencies together. The system identifies groups of the similar dependencies. The system extracts semiconductor process steps belonging to the groups.
申请公布号 US8718809(B2) 申请公布日期 2014.05.06
申请号 US20100778457 申请日期 2010.05.12
申请人 BASEMAN ROBERT J.;NOWICKI TOMASZ J.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BASEMAN ROBERT J.;NOWICKI TOMASZ J.
分类号 G06F19/00 主分类号 G06F19/00
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