发明名称 Exposure apparatus, and device manufacturing method
摘要 Exposure apparatus and methods expose a substrate with an energy beam via a projection optical system and has first and second tables on each of which a substrate is mountable. A mark detection system is arranged in a second area different from a first area in which the projection optical system is arranged. A substrate mounted on one of the first and second tables is moved in the first area while the one table is held by a first movable member. A substrate mounted on another of the first and second tables is moved in the second area while the another table is held by a second movable member. The tables held by the first and second movable members are driven so that the another table is moved from the second to the first movable member to be held in place of the one table.
申请公布号 US8717537(B2) 申请公布日期 2014.05.06
申请号 US201313853643 申请日期 2013.03.29
申请人 NIKON CORPORATION 发明人 EBIHARA AKIMITSU
分类号 G03B27/42;G03B27/52;G03F7/20 主分类号 G03B27/42
代理机构 代理人
主权项
地址