发明名称 |
SYSTEMS AND METHODS FOR DETERMINING AGING DAMAGE FOR SEMICONDUCTOR DEVICES |
摘要 |
A method includes generating a circuit design and executing a simulation of the circuit design at a plurality of time slices. Type 1 damage and type 2 damage are determined for each time slice. A total type 1 damage is provided as a sum of the type 1 damage for all of the slices in which type 1 damage is greater than type 2 damage. A total type 2 damage is similarly added for the slices where the type 2 damage is dominant. A type 1 aging effect is determined based on the total type 1 damage. A type 2 aging effect is determined based on the total type 2 damage. The type 1 aging effect is added to the type 2 aging effect to obtain a total aging effect. The circuit design is tested using the total aging effect to determine if the circuit design provides adequate lifetime performance. |
申请公布号 |
US2014123085(A1) |
申请公布日期 |
2014.05.01 |
申请号 |
US201213665256 |
申请日期 |
2012.10.31 |
申请人 |
SHROFF MEHUL D.;ABRAMOWITZ PETER P. |
发明人 |
SHROFF MEHUL D.;ABRAMOWITZ PETER P. |
分类号 |
G06F17/50;G06F9/455 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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