发明名称 DOUBLE DIFFUSED METAL OXIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 The present invention discloses a double diffused metal oxide semiconductor (DMOS) device and a manufacturing method thereof. The DMOS device includes: an isolation structure for defining device regions; a gate with a ring-shaped structure; a drain located outside the ring; and a lightly doped drain, a source, and a body electrode located inside the ring. To increase the sub-threshold voltage at the corners of the gate, the corners are located completely on the isolation structure, or the lightly doped drain is apart from the corners by a predetermined distance.
申请公布号 US2014117443(A1) 申请公布日期 2014.05.01
申请号 US201414146512 申请日期 2014.01.02
申请人 YANG CHING-YAO;HUANG TSUNG-YI;CHU HUAN-PING;SU HUNG-DER;RICHTEK TECHNOLOGY CORPORATION 发明人 YANG CHING-YAO;HUANG TSUNG-YI;CHU HUAN-PING;SU HUNG-DER
分类号 H01L29/423;H01L21/28;H01L29/66;H01L29/78 主分类号 H01L29/423
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