| 摘要 |
A method for testing an integrated circuit having memory comprises performing a structural test on the integrated circuit using data obtained from operating the memory in a functional mode. In another embodiment, an integrated circuit comprises a memory mode selection module, a memory module, and an output selection module. The memory mode selection module is configured to receive a functional mode signal and a test mode signal, and selectively transmit either the functional mode signal or the test mode signal based on a state of a control signal. The memory module is configured to receive the signal from the memory mode selection module and store data corresponding to signal to memory cells. The output selection module is configured to receive the data from the memory cells, and transmit the data to downstream circuitry, which may use the data to perform a structural test, such as a logic built-in self-test. |
