发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>The present invention relates to a semiconductor device and a manufacturing method thereof. According to one embodiment of the present invention, the semiconductor device and the manufacturing method thereof include a first impurity injection region and a second impurity injection region; a storage node contact which touches the first impurity injection region; a bit line; a bit line node contact which is arranged between the bit line and the impurity injection region; and a spacer. According to the present invention, a leakage current between the storage node contact and the bit line node contact can be prevented.</p>
申请公布号 KR20140050212(A) 申请公布日期 2014.04.29
申请号 KR20120116178 申请日期 2012.10.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, KEUN NAM;PARK, SUN YOUNG;YEOM, KYE HEE;JANG, HYEON WOO;JEONG, JIN WON;CHO, CHANG HYUN;HONG, HYEONG SUN
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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