SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要
<p>The present invention relates to a semiconductor device and a manufacturing method thereof. According to one embodiment of the present invention, the semiconductor device and the manufacturing method thereof include a first impurity injection region and a second impurity injection region; a storage node contact which touches the first impurity injection region; a bit line; a bit line node contact which is arranged between the bit line and the impurity injection region; and a spacer. According to the present invention, a leakage current between the storage node contact and the bit line node contact can be prevented.</p>
申请公布号
KR20140050212(A)
申请公布日期
2014.04.29
申请号
KR20120116178
申请日期
2012.10.18
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, KEUN NAM;PARK, SUN YOUNG;YEOM, KYE HEE;JANG, HYEON WOO;JEONG, JIN WON;CHO, CHANG HYUN;HONG, HYEONG SUN