| 摘要 |
Measuring apparatus (100, 400, 500) and method for characterizing optical and photonic devices, based on spectral interferometry and minimum-phase reconstruction algorithms, which comprises a light source (101, 401, 501), an interferometric assembly (100, 400, 500) and an optical detection system (106, 406, 506), and wherein, starting from the spectral power density of a minimum-phase interferometric function, composed of an optical reference signal and an optical signal containing the characteristic of the device under test DUT (103, 503), the result is the transfer function H(omega) of the DUT (103, 503) and the corresponding pulse response h(t) thereof. |
