| 摘要 |
An electrical device having a clocked circuitry, and a method for testing the power supply unit of the electrical device. The electrical device comprises an electrical load, a clocked power supply unit, at least one pulse transformer and an evaluation device. The power supply unit comprises a power stack having at least one power semiconductor switch and is configured for generating a clocked voltage for the electrical load from an electric voltage based on an alternating on/off switching of the power semiconductor switch. The power stack exhibits at least one current path, through which an electric current flows during operation. The pulse transformer generates a signal assigned to the change in the charge and/or the direction of the electric current flowing through the current path. The evaluation device evaluates the signal coming from the pulse transformer and draws a conclusion regarding the operational reliability of the power semiconductor switch. |
